In order to estimate the spatial resolution of 3D images taken with microtomography (micro-CT) or nanotomography (nano-CT), we use test objects on the submicrometer to nanometer scale prepared by focused-ion-beam milling (FIB). The resolutions along the direction within the tomographic slice plane (in-plane or transverse resolution) and perpendicular to it (through-plane or sagittal resolution) can be determined from their square-wave patterns. The aluminum test patterns are labile in the air when it's stored for a long period, such as over one year. If possible, they should rather be stored in a vacuum chamber.
Material: aluminum wire, 0.25 mm diameter.
Pattern pitches: 2.0, 1.6, 1.2, 1.0, 0.8, 0.6, 0.5, 0.4, 0.3, 0.2 um.
Resin embedded.
Material: diamond, ca. 0.15 mm crystal.
Pattern pitches: 2.0, 1.6, 1.2, 1.0, 0.8, 0.6 um. In-plane only.
Material: aluminum rod, ca. 0.12 mm square.
Pattern pitches: 2.0, 1.0, 0.5, 0.40, 0.35, 0.30, 0.25, 0.20 um, 180, 160, 140, 120, 100, 90, 80 nm.
Material: aluminum wire, 0.10 mm diameter.
Pattern pitches: 2.0, 1.0, 0.5, 0.40, 0.35, 0.30, 0.25, 0.20 um, 180, 160, 140, 120, 100, 90, 80 nm.
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Tokai Univ